The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2013

Filed:

Apr. 23, 2010
Applicants:

Makoto Ochiai, Yokohama, JP;

Takahiro Miura, Yokohama, JP;

Mitsuaki Shimamura, Yokohama, JP;

Hidehiko Kuroda, Yokohama, JP;

Fukashi Osakata, Fujisawa, JP;

Kentaro Tsuchihashi, Yokohama, JP;

Masahiro Yoshida, Chigasaki, JP;

Inventors:

Makoto Ochiai, Yokohama, JP;

Takahiro Miura, Yokohama, JP;

Mitsuaki Shimamura, Yokohama, JP;

Hidehiko Kuroda, Yokohama, JP;

Fukashi Osakata, Fujisawa, JP;

Kentaro Tsuchihashi, Yokohama, JP;

Masahiro Yoshida, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser maintenance apparatus including a laser irradiation device which includes a first optical element for irradiating detection laser light on a test object to detect an ultrasonic wave; a second optical element for irradiating generation laser light on a test object so as to excite the ultrasonic wave; and an optical system container for containing the first and second optical element. The reflection direction of the first optical element and the reflection direction of the second optical element are arranged at an angle along the circumferential direction of the test object. The light reflected by the first optical element is irradiated at a position different than light reflected by the second optical element, and the laser irradiation positions of the light reflected by the first and second optical elements are different in the axial direction and the circumferential direction of the test object.


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