Insert for carrier board of test handler

Abstract

An insert for a carrier board of a test handler is disclosed. In a first aspect, the latch block applying to the insert is detachably coupled to the insert body. The latch block can be reused, and thus this reduces wastage of resources and eliminates the insert replacement fee. In a second aspect, the insert pocket having hooks is detachably coupled to the insert body. The insert body can be reused. The latch unit is installed to the insert pocket, so that the damaged latch unit can be easily replaced. The insert forms a plurality of holes in the bottom of the loading part thereof, to expose the leads of the semiconductor devices through the holes downwardly. Thus, the insert can load semiconductor devices regardless of the dimensions of the semiconductor devices.