The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Mar. 01, 2011
David W. Alderman, Rochester, MN (US);
Mitchell D. Felton, Rochester, MN (US);
Karl M. Solie, Rochester, MN (US);
David W. Alderman, Rochester, MN (US);
Mitchell D. Felton, Rochester, MN (US);
Karl M. Solie, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The exemplary embodiments of the present invention provide a method for efficiently identifying the bad component(s) in a multi-node system. The method includes assigning a unique ID to each of a plurality of nodes on the multi-node system, generating test statistics from a test on a plurality of nodes, and comparing the test statistics for the plurality of nodes against a first topology to generate a first number of clusters of bad nodes. The method further includes comparing the test statistics for the plurality of nodes against a second topology to generate a second number of clusters of bad nodes, and identifying the bad nodes by comparing the cluster sizes to a topology threshold.
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