The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Sep. 08, 2010
Timmie G. Reiter, Westborough, MA (US);
Carey Jay Mcmaster, Stow, MA (US);
Ronald Ray Trimble, Acton, MA (US);
Stefan Merrill King, Belmont, MA (US);
David Michael Biernacki, Woonsocket, RI (US);
Jon Christopher Kennedy, Marlborough, MA (US);
Timmie G. Reiter, Westborough, MA (US);
Carey Jay McMaster, Stow, MA (US);
Ronald Ray Trimble, Acton, MA (US);
Stefan Merrill King, Belmont, MA (US);
David Michael Biernacki, Woonsocket, RI (US);
Jon Christopher Kennedy, Marlborough, MA (US);
Sepaton, Inc., Marlborough, MA (US);
Abstract
Described are computer-based methods and apparatuses, including computer program products, for removing redundant data from a storage system. In one example, a data delineation process delineates data targeted for de-duplication into regions using a plurality of markers. The de-duplication system determines which of these regions should be subject to further de-duplication processing by comparing metadata representing the regions to metadata representing regions of a reference data set. The de-duplication system identifies an area of data that incorporates the regions that should be subject to further de-duplication processing and de-duplicates this area with reference to a corresponding area within the reference data set.