The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Sep. 25, 2007
Andrew Aymeloglu, Palo Alto, CA (US);
Kevin Simler, Fremont, CA (US);
Garry Tan, Mountain View, CA (US);
Andrew Aymeloglu, Palo Alto, CA (US);
Kevin Simler, Fremont, CA (US);
Garry Tan, Mountain View, CA (US);
Palantir Technologies, Inc., Palo Alto, CA (US);
Abstract
In one embodiment, first, second, and third inputs are received. The first input specifies a first market instrument and the second input specifies start and end dates of a first time series for the first market instrument. The third input specifies a feature set computer and the values of zero or more parameters thereof. A first feature set of the first market instrument is determined by applying the feature set computer to the first time series. A second feature set of a second market instrument is determined by applying the feature set computer to a second time series for the second market instrument, where the second time series is bounded by the start and end dates. The second feature set is correlated to the first feature set to determine a similarity score for the second market instrument, where the similarity score is a measure of the relationship between the second market instrument and the first market instrument.