The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Jun. 11, 2009
Lars Krog, Bristol, GB;
Lars Krog, Bristol, GB;
Airbus Operations Limited, Bristol, GB;
Abstract
A method of designing a composite panel, the panel comprising a plurality of zones, each zone comprising a plurality of plies of composite material, each ply in each zone having a respective orientation angle, and some of the plies running continuously between adjacent zones. A design is provided comprising a set of design variables including a thickness for each of the zones, and a ply percentage for each orientation angle for each of the zones, each ply percentage identifying a percentage of plies within a zone having a particular orientation angle. The design is modified in a series of iterations, each iteration including: analyzing the current design by calculating an objective function, a set of ply evolution constraint functions each indicating a degree of ply continuity between a respective pair of adjacent zones, and one or more structural constraint functions; performing a sensitivity analysis by calculating partial derivatives of the objective function for the current design with respect to a selected set of the design variables, and calculating partial derivatives of the constraint functions for the current design with respect to a selected set of the design variables; and generating a new design by determining an optimum update of the design variables in accordance with the analysis and the sensitivity analysis.