The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Feb. 02, 2010
Applicants:
Lance F. Bentley Tammero, Oakland, CA (US);
John M. Dzenitis, Danville, CA (US);
Benjamin J. Hindson, Livermore, CA (US);
Inventors:
Lance F. Bentley Tammero, Oakland, CA (US);
John M. Dzenitis, Danville, CA (US);
Benjamin J. Hindson, Livermore, CA (US);
Assignee:
Lawrence Livermore National Security, LLC, Livermore, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/24 (2011.01); G06F 19/20 (2011.01); C12Q 1/68 (2006.01); G01N 33/53 (2006.01); G01N 33/569 (2006.01);
U.S. Cl.
CPC ...
G06F 19/24 (2013.01); G06F 19/20 (2013.01); C12Q 1/6813 (2013.01); G01N 33/53 (2013.01); G01N 33/569 (2013.01); C12Q 1/6888 (2013.01);
Abstract
Methods to improve the performance of an array assay are described. A correlation between fluorescence intensity-related parameters and negative control values of the assay is determined. The parameters are then adjusted as a function of the correlation. As a result, sensitivity of the assay is improved without changes in its specificity.