The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2013

Filed:

Sep. 28, 2010
Applicant:

Masatoshi Kagawa, Tokyo, JP;

Inventor:

Masatoshi Kagawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A binary intensity-modulated light signal to be monitored is split into three signal beams. The first and third beams are converted into electric signals. Frequencies of the first electric signal corresponding to a bit rate pass a filter bank. The intensity of the filtered signal is detected by an RF intensity detector. A delaying interferometer makes the second beam interfere with a light signal obtained by delaying the second beam by a predetermined delay time. One of the resulting interference signals is converted into an electric signal. The intensities of the amplified signal are detected by another RF intensity detector. The third electric signal is smoothed by the filter bank, and its average intensity is detected by a power detector. The intensities of the detected, amplified signals are found relative to the detected average intensity to determine wavelength dispersion and optical SNR or the tendency of their changes.


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