The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Jul. 06, 2009
Yu-ta Wang, Taipei, TW;
Po-kai Hsu, Taipei, TW;
Kuang-yu Hsu, Taipei, TW;
Dong-yo Jheng, Taipei, TW;
Chien-chung Tsai, Taipei, TW;
Sheng-lung Huang, Taipei, TW;
Yu-Ta Wang, Taipei, TW;
Po-Kai Hsu, Taipei, TW;
Kuang-Yu Hsu, Taipei, TW;
Dong-Yo Jheng, Taipei, TW;
Chien-Chung Tsai, Taipei, TW;
Sheng-Lung Huang, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
The present invention relates to an optical imaging apparatus and a method, and more particularly to an optical imaging apparatus and a method with short coherence length optical source. The apparatus comprises an optical source with a plurality of outputs for providing a reference light and a sample light; a sample probe module for leading the sample light to a sample, and leading an information light out; an interference module for leading the reference light to a photo detector, and leading the information light to the photo detector; and a signal processing unit electrically coupled to the photo detector; wherein the reference light and the information light are superimposed on the photo detector, an interference light pattern is detected by the photo detector, and a signal that represents the interference light pattern is transmitted to said signal processing unit for analyzing the spatial information of the sample.