The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2013

Filed:

Sep. 07, 2012
Applicants:

Tetsuo Mise, Tokyo, JP;

Hiroyuki Nemoto, Kanagawa, JP;

Eiji Shintaku, Tokyo, JP;

Manabu Yamauchi, Tokyo, JP;

Toshiki Ono, Tokyo, JP;

Inventors:

Tetsuo Mise, Tokyo, JP;

Hiroyuki Nemoto, Kanagawa, JP;

Eiji Shintaku, Tokyo, JP;

Manabu Yamauchi, Tokyo, JP;

Toshiki Ono, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/222 (2006.01); H04N 5/445 (2006.01); G03B 17/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging apparatus includes: a control unit configured to move a focusing lens, and detect a focus position; wherein the control unit executes auto-focus (AF) scan processing in which only a part of a range of movement of the focusing lens is set as a scan range, as first scan processing, and executes auto-focus (AF) scan processing in which a region including a region differing from the scan region of the first scan processing is set as a scan range, as second scan processing, in the event that a focus point is not detected in the first scan processing.


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