Leakage tolerant delay locked loop circuit device

Abstract

Leakage tolerant delay locked loop (DLL) circuit devices and methods of locking phases of output phase signals to a phase of a reference signal using a leakage tolerant DLL circuit device are provided. Embodiments include a DLL circuit device comprising: a primary loop and a secondary correction circuit. The primary loop includes a phase detector, an error controller, and a voltage controlled buffer (VCB). The secondary correction circuit is configured to generate and provide secondary error-delay signals to the error controller. The secondary correction circuit includes multiple error generators. Each error generator is configured to generate a secondary error-delay signal in response to detecting a particular edge of an output phase signal from the VCB. The primary loop is configured to control a phase adjustment based on at least one of a first error-delay-increase signal, a first error-delay-decrease signal, and the secondary error-delay signals.