The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Jun. 06, 2011
Allen D. Parks, Spotsylvania, VA (US);
Allen D. Parks, Spotsylvania, VA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A magnetometer is provided for detecting a magnetic field of strength B using the Faraday effect. The magnetometer includes a photon emitter, a first polarizer, a prism, a second polarizer, a detector and an analyzer. The emitter projects an emitted light beam substantially parallel to the magnetic field and having wavelength λ. The prism has an interface surface and is composed of a Faraday medium having Verdet value V. The emitted light beam passes through the first polarizer and then the prism, exiting from the interface surface making an incident angle θto normal of the surface and then refracting into a secondary medium as first and second circularly polarized light beams that are separated by a small angular divergence δ. These polarized light beams have average refraction angle θ to the normal and pass through a post-selection polarizer before the detector measures a weak value Aof a photon having 'which path' operator  associated with the polarized light beams. The magnetic field strength is determined as The parameters include nas index of refraction of the secondary medium, and ε as amplification factor. The pointer rotation angle Acan be expressed as in which θand θare respectively right- and left-polarized refraction angles with the average refraction angle such that The pointer rotation angle Acan be approximated as A≈δ/2ε when 0<ε<<1. A method is provided incorporating operations described for the magnetometer.