The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Jul. 31, 2009
Youngseok Choi, Daejeon, KR;
Seungwoo Jeong, Seoul, KR;
Hoon Choi, Incheon, KR;
LG Display Co. Ltd., Seoul, KR;
Abstract
This document relates to a probe inspection apparatus for testing a flat panel display. The probe inspection apparatus comprises a base plate, a stage placed over the base plate and configured to comprise a plurality of back light modules for supplying a rear surface of a substrate with light or heat or both, the substrate being seated in the stage, a probe pin configured to electrically come into contact with circuit patterns formed in the substrate and measure electrical properties of the circuit patterns, a probe head configured to support the probe pin and move in an X or Y axis, and an upper light source unit mounted on one side of the probe head and configured to irradiate light to the circuit patterns.