The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Nov. 30, 2010
Francis Glasser, Eybens, FR;
Michel Garcin, Saint Nizier du Moucherotte, FR;
Francis Glasser, Eybens, FR;
Michel Garcin, Saint Nizier du Moucherotte, FR;
Abstract
The general field of the invention includes methods of calibrating X-ray detection systems, the systems including at least one X-ray generator and a detection array having a matrix of detecting semiconductor pixels and processing and calibration electronics. The calibration method includes, for all or some of the pixels: operating the X-ray generator at its nominal high voltage, the generator being placed opposite the detector; counting, using the processing and calibration electronics, the pulses emitted by each pixel through the effect of the radiation produced by the generator; establishing, for each pixel, an amplitude distribution for the counted pulses; applying, to each amplitude distribution, a statistical indicator so as to identify a particular amplitude, this particular amplitude then corresponding to the energy corresponding to said statistical indicator; and adjusting, using the processing and calibration electronics, calibration parameters for each pixel, taking account of the energy-amplitude relationship thus established.