The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2013

Filed:

Apr. 21, 2011
Applicants:

Martin Hacker, Jena, DE;

Scott A. Meyer, Livermore, CA (US);

Inventors:

Martin Hacker, Jena, DE;

Scott A. Meyer, Livermore, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A solution for attaining high-precision and reproducible measurements during opthalmological biometry and imaging includes an illumination unit for producing a fixation marker, a device for transmitting the light of the produced fixation marker into the eye, a measurement device and a control unit. The illumination unit includes a device for the targeted change of the beam direction of the produced fixation marker. A camera for the detection of the line of vision of the eye is connected to the control unit. The control unit determines the sufficient congruity between detected line of vision and displayed beam direction of the produced fixation marker and, in dependence of the degree of probability of the congruity, triggers a measurement. The suggested arrangement is applicable for opthalmological diagnostic devices, which exhibit a camera and a measuring system, whereby measurements can be taken in all areas of the eye.


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