The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2013
Filed:
Dec. 16, 2010
Applicants:
Jie Tan, Beijing, CN;
Zhiyuan Zhu, Beijing, CN;
Hongsheng Zhao, Beijing, CN;
Inventors:
Assignee:
Chinese Academy of Sciences Institute of Automation, Beijing, CN;
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus for testing the performance of Radio Frequency Identification (RFID) system, comprising: The present invention utilizes circular motion in the lab to simulate rectilinear motion in the practical application. The present invention reduces the volume of RFID test device and the space in the lab, and improves the flexibility of the test.
Quick Actions:
Tan, Jie. (2013). Method and apparatus for testing the performance of radio frequency identification system (U.S. Patent No. 8490876). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8490876
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile