The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Mar. 29, 2007
Dong-hoon Yoo, Yongin-si, KR;
Soo-jung Ryu, Yongin-si, KR;
Jeong-wook Kim, Yongin-si, KR;
Hong-seok Kim, Yongin-si, KR;
Hee Seok Kim, Yongin-si, KR;
Dong-Hoon Yoo, Yongin-si, KR;
Soo-Jung Ryu, Yongin-si, KR;
Jeong-Wook Kim, Yongin-si, KR;
Hong-Seok Kim, Yongin-si, KR;
Hee Seok Kim, Yongin-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A profiler which provides information to optimize an application specific architecture processor and a program for the processor is provided. The profiler includes: an architecture analyzer which analyzes an architecture description, and generates architecture analysis information, the architecture description describing an architecture of an application specific architecture processor which comprises a plurality of processing elements; a static analyzer which analyzes program static information that describes static information of a program, and generates static analysis information; a dynamic analyzer which analyzes program dynamic information that describes dynamic information of the program, and generates dynamic analysis information, the dynamic information of the program being generated by simulating the program; and a cross profiling analyzer which generates information for optimizing the application specific architecture processor to implement the program based on at least one of the architecture analysis information, the static analysis information, and the dynamic analysis information.