The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

May. 20, 2005
Applicants:

Sandeep Shrivastava, Burlington, MA (US);

Rajendra Inamdar, N. Cheimsford, MA (US);

Ryan Lecompte, Natick, MA (US);

R. Sean Lindsay, Watertown, MA (US);

Stephen Hess, North Reading, MA (US);

Richard Mousseau, Stratham, NH (US);

Inventors:

Sandeep Shrivastava, Burlington, MA (US);

Rajendra Inamdar, N. Cheimsford, MA (US);

Ryan LeCompte, Natick, MA (US);

R. Sean Lindsay, Watertown, MA (US);

Stephen Hess, North Reading, MA (US);

Richard Mousseau, Stratham, NH (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Metadata can be used for determining or selecting debug points to activate for server software. The metadata can be used for selecting or logically grouping the debug point without requiring the selecting of debug points based upon package boundaries. The metadata can be used by the system to produce a select set of the debug activation information. This debug activation information can be used by a management unit to activate debug points in the server software.


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