The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Sep. 14, 2010
Applicants:

Minoru Nakatsugawa, Kanagawa, JP;

Takeichiro Nishikawa, Kanagawa, JP;

Ryusei Shingaki, Tokyo, JP;

Inventors:

Minoru Nakatsugawa, Kanagawa, JP;

Takeichiro Nishikawa, Kanagawa, JP;

Ryusei Shingaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, an evaluating apparatus includes an operation data storage unit, a labeling unit, a learning unit, and an evaluating unit. The labeling unit applies a failure label, indicating that a product is broken down, to operation data of the product that is broken down within a designated period of time from the observation date of the operation data, while applies a non-failure label, indicating that the product is not broken down, to the operation data of the product that is not broken down within a designated period of time from the observation date of the operation data. The labeling unit applies neither the failure label nor the non-failure label to the operation data of the product, which is not certain that it is broken down or not within a designated period of time from the observation date of the operation data.


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