The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Apr. 15, 2005
Applicants:

Anders B. Vinberg, Kirkland, WA (US);

Anand Lakshminarayanan, Redmond, WA (US);

Ashvinkumar J. Sanghvi, Sammamish, WA (US);

Vij Rajarajan, Issaquah, WA (US);

Vitaly Voloshin, Issaquah, WA (US);

Bassam Tabbara, Seattle, WA (US);

Kevin Grealish, Seattle, WA (US);

Rob Mensching, Redmond, WA (US);

Geoffrey Outhred, Seattle, WA (US);

Galen C. Hunt, Bellevue, WA (US);

Aamer Hydrie, Seattle, WA (US);

Robert V. Welland, Seattle, WA (US);

Inventors:

Anders B. Vinberg, Kirkland, WA (US);

Anand Lakshminarayanan, Redmond, WA (US);

Ashvinkumar J. Sanghvi, Sammamish, WA (US);

Vij Rajarajan, Issaquah, WA (US);

Vitaly Voloshin, Issaquah, WA (US);

Bassam Tabbara, Seattle, WA (US);

Kevin Grealish, Seattle, WA (US);

Rob Mensching, Redmond, WA (US);

Geoffrey Outhred, Seattle, WA (US);

Galen C. Hunt, Bellevue, WA (US);

Aamer Hydrie, Seattle, WA (US);

Robert V. Welland, Seattle, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); G06F 15/177 (2006.01);
U.S. Cl.
CPC ...
Abstract

Model-based system monitoring includes accessing a model of a system that includes multiple components and executing a monitoring policy to monitor performance of the system. A notification of a problem is received from a first component. A determination is made regarding the cause of the problem. The determination is made, at least in part, based on the model of the system. At least one component associated with the cause of the problem is then identified.


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