The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Jan. 22, 2009
Nobuo Sato, Saitama, JP;
Satomi Tsuji, Kokubunji, JP;
Kazuo Yano, Hino, JP;
Norihiko Moriwaki, Hino, JP;
Norio Ohkubo, Tokyo, JP;
Yoshihiro Wakisaka, Kunitachi, JP;
Nobuo Sato, Saitama, JP;
Satomi Tsuji, Kokubunji, JP;
Kazuo Yano, Hino, JP;
Norihiko Moriwaki, Hino, JP;
Norio Ohkubo, Tokyo, JP;
Yoshihiro Wakisaka, Kunitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An analysis sever capable of performing analysis among a large amount of sensor data in order to obtain an analysis result that a reader desires and outputting the result instantaneously. The analysis server rearranges the sensor data acquired from a sensor node into time series data. The analysis is performed separately for time trigger analysis (D) and for event trigger analysis (F) depending on analysis contents. In the time trigger analysis (D), analysis processing that is basically needed when visualizing a state of an organization is performed. In the event trigger analysis (F), an analysis result obtained by the time trigger analysis (D) is processed using the reader's desired information and is outputted.