The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Nov. 30, 2005
Henry J. May, Mantorville, MN (US);
Richard K. Kirkman, Rochester, MN (US);
Henry J. May, Mantorville, MN (US);
Richard K. Kirkman, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Method for measuring the performance of a multi-nodal computer system. In one embodiment, a number of system related events may be instrumented. When an instrumented event occurs, instrumentation routines may be invoked to record the state of system variables related to the event. In particular, events such as thread creation, dispatch, and nodal events such as events related to verifying or changing workload distribution in a multi-nodal system, among others, may be instrumented to record the state of variables as these events occur in a running multi-nodal computer system.