The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Mar. 04, 2011
Applicants:

Peter Yeh, San Jose, CA (US);

Prateek Jain, Dayton, OH (US);

Kunal Verma, Sunnyvale, CA (US);

Reymonrod G. Vasquez, San Jose, CA (US);

Inventors:

Peter Yeh, San Jose, CA (US);

Prateek Jain, Dayton, OH (US);

Kunal Verma, Sunnyvale, CA (US);

Reymonrod G. Vasquez, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 17/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An information source alignment system may include a tree generation module executed by a computer system to generate a source category hierarchy tree for a source class in a first information source and a target category hierarchy tree for a target class in a second information source. The source and target category hierarchy trees may be constructed from a class hierarchy of a knowledge source. A class-similarity determination module may compare the source and target category hierarchy trees. An alignment module may determine whether the source and target classes are aligned based on the comparison of the source and target category hierarchy trees.


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