The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Dec. 03, 2008
Applicants:

Sudripto DE, Munirka, IN;

Srinivas Narasimhamurthy, Bangalore, IN;

Ashish Sureka, New Delhi, IN;

Satyabrata Pradhan, Sundargarh, IN;

Inventors:

Sudripto De, Munirka, IN;

Srinivas Narasimhamurthy, Bangalore, IN;

Ashish Sureka, New Delhi, IN;

Satyabrata Pradhan, Sundargarh, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 7/60 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and computer program product for the root cause analysis of the failure of a manufactured product is disclosed. The present invention includes the development of a knowledge model, based on information obtained from historical warranty claim forms and various manufacturing data sources. The invention also includes processing text information in a free-form text that is obtained from warranty claim forms by using text-tagging and annotation techniques. Thereafter, the knowledge model is converted to a Bayesian network. The present invention provides a user interface to select parameters and corresponding instances from current warranty claim forms. The selected parameters and corresponding instances are used as input evidence for the Bayesian network. The present invention facilitates the process of drawing inferences for root cause analysis of the failure of manufactured products and corresponding probabilities.


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