The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

May. 16, 2011
Applicants:

Daniel Geist, Haifa, IL;

Mark Ginzburg, Be'er Sheva, IL;

Yoad Lustig, Nesher, IL;

Ishai Rabinovotz, Haifa, IL;

Ohad Shacham, Kfar Monash, IL;

Rachel Tzoref, Haifa, IL;

Inventors:

Daniel Geist, Haifa, IL;

Mark Ginzburg, Be'er Sheva, IL;

Yoad Lustig, Nesher, IL;

Ishai Rabinovotz, Haifa, IL;

Ohad Shacham, Kfar Monash, IL;

Rachel Tzoref, Haifa, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods that use a solver to find bugs in a target model of a computing system having one or more finite computation paths are provided. The bugs on computation paths of less than a predetermined length are detected by translating the target model to include a state variable AF for one or more states of the target model, wherein AF(S) represents value of the state variable AF at state S; and solving the translated version of the target model that satisfies predetermined constrains.


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