The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Jan. 25, 2010
Applicant:

Matthias Bertram, Aachen, DE;

Inventor:

Matthias Bertram, Aachen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a detection values correction apparatus for correcting detection values of a projection image of a multi-energy imaging system. A scatter contribution providing unit provides scatter contributions for different intensities, different energies and different locations on the detection surface of the detection values. A scatter contributions combining unit combines scatter contributions for correcting a detection value, wherein the combined scatter contributions represent the contribution of the scatter, which is caused by radiation of the other detection values of the projection image, to the detection value to be corrected and wherein the scatter contributions are combined under consideration of the intensity, energy and location on the detection surface of the other detection values. A correction unit scatter corrects the detection value of the projection image by using the combined scatter contributions.


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