The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Oct. 07, 2009
Mikael Rousson, Cannes, FR;
Jan Erik Solem, Bjärred, SE;
Jerome Piovano, Juan les pins, FR;
Apple Inc., Cupertino, CA (US);
Abstract
A method of computing global-to-local metrics for recognition. Based on training examples with feature representations, the method automatically computes a local metric that varies over the space of feature representations to optimize discrimination and the performance of recognition systems. Given a set of points in an arbitrary features space, local metrics are learned in a hierarchical manner that give low distances between points of same class and high distances between points of different classes. Rather than considering a global metric, a class-based metric or a point-based metric, the proposed invention applies successive clustering to the data and associates a metric to each one of the clusters.