The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Nov. 26, 2010
Applicant:
Yasushi Ichizawa, Musashino, JP;
Inventor:
Yasushi Ichizawa, Musashino, JP;
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An X-ray measurement apparatus includes an X-ray source configured to emit an X-ray to irradiate a specimen with the X-ray, a collimator configured to shape a beam of the X-ray emitted from the X-ray source into a sliced fan-shaped beam x-ray, a flux shield configured to block a part of a flux of the fan-shaped beam X-ray so as to suppress beam hardening while adjusting an energy intensity distribution of the flux, the flux shield being placed between the collimator and the specimen, and an X-ray detector configured to detect a dose transmitted through the specimen.