The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Nov. 10, 2010
Applicants:
Geon Hee Kim, Daejeon, KR;
Sun Choel Yang, Daejeon, KR;
Ki Soo Chang, Daejeon, KR;
Hyo Sik Kim, Daejeon, KR;
Sang Hyeok Kim, Yongin-si, KR;
Sang Yong Lee, Daejeon, KR;
Inventors:
Geon Hee Kim, Daejeon, KR;
Sun Choel Yang, Daejeon, KR;
Ki Soo Chang, Daejeon, KR;
Hyo Sik Kim, Daejeon, KR;
Sang Hyeok Kim, Yongin-si, KR;
Sang Yong Lee, Daejeon, KR;
Assignee:
Korea Basic Science Institute, Daejeon, KR;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/14 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 13/14 (2013.01); G02B 21/02 (2013.01);
Abstract
Provided is an optical system for a thermal image microscope. The optical system includes an image forming unit and a relay unit. The image forming unit forms a focus. The relay unit elongates an optical path. Here, the image forming unit includes six lenses. The relay unit includes two lenses. Aspherical surfaces of the lenses are all convex surfaces.