The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8488124 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 16, 2013

Filed:

Jan. 17, 2012
Applicants:

Grigory Valentinovich Gelikonov, Nizhny Novgorod, RU;

Valentin Mikhailovich Gelikonov, Nizhny Novgorod, RU;

Pavel Andreevich Shilyagin, Nizhny Novgorod, RU;

Inventors:

Grigory Valentinovich Gelikonov, Nizhny Novgorod, RU;

Valentin Mikhailovich Gelikonov, Nizhny Novgorod, RU;

Pavel Andreevich Shilyagin, Nizhny Novgorod, RU;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical low-coherence reflectometry with spectral reception for obtaining images without coherent noise caused by self-interference of the radiation scattered from the studied object and by spurious reflections in the optical path of the system is disclosed. Two or more consecutive measurements of the interference spectrum are made. During at least one measurement of the interference spectrum by means of the interference control unit the phase between the interfering parts of the radiation is modulated by a certain law during exposure, which results in averaging and zeroing of the cross-correlation (useful) component of the registered spectrum, and during at least one additional measurement of the interference spectrum, the phase between the interfering parts of the radiation is not modulated during exposure. The phase between the interfering parts of the radiation may be set to be different in additional measurements of the interference spectrum.


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Gelikonov, Grigory. (2013). Spectral reflectometry method and device (U.S. Patent No. 8488124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8488124

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