The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Mar. 15, 2011
Vishnu Vardhan Krishnamachari, Mannheim, DE;
Vishnu Vardhan Krishnamachari, Mannheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
An apparatus for the microscopic examination of an object has an illumination system which generates a first illumination light beam and a second illumination light beam. A first polarization filter () circularly polarizes the first illumination light beam. A second polarization filter () linearly polarizes the second illumination light beam. A modulator () allows a modulation of the polarized second illumination light beam. An excitation optical system directs the two illumination light beams onto an object. A detection optical system directs detection light beams emanating from the object onto at least two detector units, a first detector unit detecting a first nonlinear Raman effect and a second detector unit detecting a second nonlinear Raman effect.