The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Nov. 02, 2012
Applicant:

Panduit Corp., Tinley Park, IL (US);

Inventors:

Richard J. Pimpinella, Frankfort, IL (US);

Gaston E. Tudury, Lockport, IL (US);

Assignee:

Panduit Corp., Tinley Park, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A new metric applicable to the characterization and design of multimode fiber (MMF) is described. The metric is derived from a Differential Mode Delay (DMD) measurement and when used in combination with industry-standard metrics such as Effective Modal Bandwidth (EMB) and DMD, yields a more accurate prediction of MMF channel link performance as measured by Bit Error Rate (BER) testing. The metric can also be used in the design of MMF for improved bandwidth performance. When implemented as a test algorithm in production, it can be used to select, sort, or verify fiber performance. This process can yield a multimode fiber design with a greater performance margin for a given length, and/or a greater length for a given performance margin.


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