The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Aug. 18, 2011
Applicants:

Sosuke Akao, Tokyo, JP;

Takeshi Itoi, Tokyo, JP;

Inventors:

Sosuke Akao, Tokyo, JP;

Takeshi Itoi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phase-type diffraction device includes a substrate having a front surface and a solidified liquid crystal layer formed on the front surface of the substrate and constituted by a continuous film containing at least a liquid crystal compound. The solidified liquid crystal layer is constituted by first, second and third regions arranged periodically, the third region being interposed between the first region and the second region. The first region is optically anisotropic and the second region is optically isotropic, the third region is not optically isotropic, a degree of orientation of mesogens of the liquid crystal compound being lower than that of the first region. An in-plane average refractive index nof the second region is different from an in-plane average refractive index nof the first region and an in-plane average refractive index nof the third region is between nand n.


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