The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2013

Filed:

Apr. 26, 2011
Applicants:

Shingo Nagataki, Kanagawa, JP;

Kenji Wajima, Tokyo, JP;

Hiroshi Yamamoto, Chiba, JP;

Katsuhisa Shinmei, Kanagawa, JP;

Inventors:

Shingo Nagataki, Kanagawa, JP;

Kenji Wajima, Tokyo, JP;

Hiroshi Yamamoto, Chiba, JP;

Katsuhisa Shinmei, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing apparatus includes: an image sensor outputting at least long and short accumulation images with longer and shorter exposure times, respectively, in one field; first and second long accumulation evaluation value computation units computing first and second long accumulation evaluation values from the long accumulation image; a short accumulation evaluation value computation unit computing a short accumulation evaluation value from the short accumulation image; a short accumulation exposure control unit acquiring a short accumulation target exposure time and short accumulation exposure control information from the short accumulation evaluation value and a first target level; a long accumulation evaluation value synthesis unit acquiring a long accumulation evaluation value by synthesizing the first long accumulation evaluation value and the second long accumulation evaluation value; a long accumulation exposure control unit acquiring long accumulation exposure control information from the long accumulation evaluation value and a second target level; and a synthesis unit generating one image from the long accumulation image and the short accumulation image.


Find Patent Forward Citations

Loading…