The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8487643 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 16, 2013

Filed:

Mar. 05, 2010
Applicants:

Yupeng Chen, Beijing, CN;

Hua Liu, Beijing, CN;

Haoran Gao, Beijing, CN;

Yu LU, Beijing, CN;

Inventors:

Yupeng Chen, Beijing, CN;

Hua Liu, Beijing, CN;

Haoran Gao, Beijing, CN;

Yu Lu, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/304 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a substrate with a substrate test circuit. In an embodiment, by making the length of the wiring from a first data-line-test input terminal to a first panel equal to that of the wiring from a second data-line-test input terminal to the first panel, the input resistances between two test input terminals of a first data-line-test line and the first panel are identical, and thus when a data line of the first panel is detected, the voltage drops of test signals inputted from the two test input terminals are the same, and the test signals actually loaded to the first panel are the same and the detecting abilities are identical.


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