The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Mar. 31, 2011
Thorsten Feiweier, Poxdorf, DE;
Tony Hyun Kim, Cambridge, MA (US);
David Andrew Porter, Poxdorf, DE;
Thorsten Feiweier, Poxdorf, DE;
Tony Hyun Kim, Cambridge, MA (US);
David Andrew Porter, Poxdorf, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
In a method and apparatus to reduce distortions in diffusion imaging, at least one first measurement is implemented with a first diffusion weighting for a number of slices that are spatially separated from one another and at least one second measurement is implemented with a second diffusion weighting for the number of slices that are spatially separated from one another. A deskewing function is determined as are correction parameters to deskew diffusion-weighted magnetic resonance images on the basis of the measurements, so that image information and/or correction parameters of different slices are linked with one another. The diffusion-weighted magnetic resonance images are distortion-corrected on the basis of the deskewing function and the correction parameters.