The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Apr. 29, 2011
Robert Haslinger, Gröbenzell, DE;
Patrick Leyendecker, Gräfeling, DE;
Robert Haslinger, Gröbenzell, DE;
Patrick Leyendecker, Gräfeling, DE;
Deutsches Zentrum fur-Luft-und Raumfahrt E.V., Cologne, DE;
Abstract
The invention refers to a method for measuring fluorescence lifetime. An excitation light radiation (), periodically modulated in a first frequency, is directed to a fluorescent material (). For the measurement of fluorescence lifetime, the phase difference between the excitation light radiation () and the fluorescent radiation () is measured, the fluorescent radiation being detected by a fluorescent radiation detector (). According to the invention, a correction signal (), periodically modulated in a second frequency, is supplied to a measuring circuit (), and a phase drift between the emitted correction signal () and the correction signal () processed by the measuring circuit is measured, the phase drift being caused by the measuring circuit. This phase drift is set off against the phase difference between the excitation light radiation () and the fluorescent radiation () which is measured by the fluorescent radiation detector (), so as to compensate for the measuring error caused by the phase drift of the measuring circuit.