The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Sep. 03, 2009
Eiji Yokoi, Tokyo, JP;
Yoshinori Iketaki, Oume, JP;
Eiji Yokoi, Tokyo, JP;
Yoshinori Iketaki, Oume, JP;
Olympus Corporation, Tokyo, JP;
Abstract
The present invention provides an optical microscope capable of suppressing unnecessary response light as a background and detecting desired response light in nonlinear optical response process with a good S/N ratio. The optical microscope for collecting, on a sample, stimulation light emitted from a stimulation light sourceand having a single wavelength or a plurality of different wavelengths, and detecting response light emitted from the samplein nonlinear optical response process, comprises: an erase light sourcefor emitting erase light having a wavelength different from that of the stimulation light and inducing an effect of suppressing secondary response light which appears due to irradiation of the stimulation light on the sample, wherein the erase light and the stimulation light are simultaneously irradiated on the samplesuch that the erase light does not suppress response light emitted from a light-collecting area of the stimulation light but suppresses the secondary response light other than the response light emitted from a light-collecting area of the stimulation light.