The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 16, 2013
Filed:
Aug. 02, 2007
Takao Goto, Kuwana, JP;
Makoto Tanaka, Mie, JP;
Takao Goto, Kuwana, JP;
Makoto Tanaka, Mie, JP;
Hitachi Metals, Ltd., Tokyo, JP;
Abstract
It is possible to respecify the product (mass flow controller) corresponding to multiple types of actual process gases and multiple flow rate ranges, even after the mass flow controller has been shipped. With the mass flow rate control device in an initial state, calibration gas characteristic data is derived by measuring actual flow rate versus a flow rate setting signal using a calibration gas, and this calibration gas characteristic data is then saved to control unit. Meanwhile, actual gas characteristic data is derived by measuring actual flow rate versus a flow rate setting signal for each of a plurality of types of actual gas, and this actual gas characteristic data is then saved to a storage medium. Subsequently, prior to operating the mass flow rate control device, the actual gas characteristic data for an actual process gas is read from the storage medium via a computer, and the calibration gas characteristic data that was saved to the control unit is read out. The calibration gas characteristic data is then converted to controlled flow rate correction data based on the actual gas characteristic data, and the controlled flow rate correction data is saved to the control unit. Actual gas flow rate is corrected based on this controlled flow rate correction data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile