The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Mar. 12, 2007
Murali Raja, Bangalore, IN;
Josephine Suganthi, Sunnyvale, CA (US);
Sandeep Kamath, Bangalore, IN;
Sergey Verzunov, Moscow, RU;
Murali Raja, Bangalore, IN;
Josephine Suganthi, Sunnyvale, CA (US);
Sandeep Kamath, Bangalore, IN;
Sergey Verzunov, Moscow, RU;
Citrix Systems, Inc., Fort Lauderdale, FL (US);
Abstract
The present invention provides improvements to load balancing by providing a load balancing solution that distributes a load among a plurality of heterogenous devices, such as different types of local load balancers, using metrics collected from the different devices. The load balancing appliance collects metrics from heterogenous devices using a network management protocol and communication model, such as a Simple Network Management Protocol (SNMP). These heterogenous device metrics are available on the load balancing appliance with appliance determined metrics and metrics obtained by the appliance from homogenous devices using a metric exchange protocol. Via a configuration interface of the appliance, a user can select one or more of these different metrics for global load balancing. As such, the load balancing appliance described herein obtains a multitude of metrics from the different devices under management. Additionally, the load balancing appliance described herein provides great flexibility in allowing the user to configure the global load balancer based on the user's understanding of these multitudes of metrics and to take into account the different characteristics and behaviors of the heterogenous devices.