The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Apr. 15, 2011
Applicants:

Mutsugu Kuboki, Niigata, JP;

Yuki Kurokawa, Kyoto, JP;

Takuma Marakami, Kanagawa, JP;

Tetsuya Nasukawa, Kanagawa, JP;

Yuya Unno, Kanagawa-ken, JP;

Inventors:

Mutsugu Kuboki, Niigata, JP;

Yuki Kurokawa, Kyoto, JP;

Takuma Marakami, Kanagawa, JP;

Tetsuya Nasukawa, Kanagawa, JP;

Yuya Unno, Kanagawa-ken, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A defect predicate expression extraction device. The device extracts, as candidates for predicate expressions representing defects, predicate expressions occurring in the neighborhood of predicate modifying expressions representing suddenness or predicate modifying expressions representing repeatability. The defect predicate expression extraction device further extracts, as predicate expressions representing normality, predicate expressions occurring in the neighborhood of predicate modifying expressions representing normality and extracts predicate expressions representing defects by removing the predicate expressions representing normality from a list of the candidates for predicate expressions representing defects.


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