The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Mar. 30, 2011
Hiroshi Arimoto, Yokohama, JP;
Hiroshi Arimoto, Yokohama, JP;
Fujitsu Semiconductor Limited, Yokohama, JP;
Abstract
An integrated circuit manufacturing method comprising: calculating a threshold value from a value of a parameter which characterizes at least a part of a design pattern shape of a transistor on the target path; calculating a difference between the calculated threshold value and a target threshold value; calculating a change quantity of a gate length corresponding to the difference between the threshold value and the target threshold value according to the functional relation between the threshold value of the transistor and the gate length, which is determined based on the empirical value or the experimental value; reducing, by the change quantity, the gate length of the transistor on the target path; and manufacturing an integrated circuit on the basis of design information of the circuit including the transistor of which the gate length is changed.