The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Apr. 23, 2010
Steven William Mclaughlin, Decatur, GA (US);
Demijan Klinc, Atlanta, GA (US);
Byung-jae Kwak, Daejeon, KR;
Dong Seung Kwon, Daejeon, KR;
Steven William McLaughlin, Decatur, GA (US);
Demijan Klinc, Atlanta, GA (US);
Byung-Jae Kwak, Daejeon, KR;
Dong Seung Kwon, Daejeon, KR;
Georgia Tech Research Corporation, Atlanta, GA (US);
Electronic and Telecommunications Research Institute, Daejon, KR;
Abstract
Systems and methods for selecting a puncturing pattern for a low density parity check (LDPC) code are disclosed. One such method comprises: selecting a puncture pattern distribution for the LDPC code; calculating a security threshold and a reliability threshold for the LDPC, the LDPC having the selected puncture pattern distribution and also described by a degree distribution; storing the selected puncture pattern distribution responsive to a security gap for the LDPC being a lowest value encountered in any prior iterations; selecting another puncture pattern distribution for the LDPC code; and repeating the calculating, the storing, and the selecting another puncture pattern distribution steps.