The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jun. 24, 2010
Applicants:

Luiz C. Alves, Hopewell Junction, NY (US);

Luis A. Lastras-montano, Cortlandt Manor, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

Eldee Stephens, Waterbury, CT (US);

Lisa C. Gower, LaGrangeville, NY (US);

Inventors:

Luiz C. Alves, Hopewell Junction, NY (US);

Kevin C. Gower, LaGrangeville, NY (US);

Luis A. Lastras-Montano, Cortlandt Manor, NY (US);

Patrick J. Meaney, Poughkeepsie, NY (US);

Eldee Stephens, Waterbury, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Error correction and detection in a redundant memory system that includes a memory controller; a plurality of memory channels in communication with the memory controller, the memory channels including a plurality of memory devices; a cyclical redundancy code (CRC) mechanism for detecting that one of the memory channels has failed, and for marking the memory channel as a failing memory channel; and an error correction code (ECC) mechanism. The ECC is configured for ignoring the marked memory channel and for detecting and correcting additional memory device failures on memory devices located on one or more of the other memory channels, thereby allowing the memory system to continue to run unimpaired in the presence of the memory channel failure.


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