The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Jan. 14, 2010
Antony John Penton, Cambridge, GB;
Simon Andrew Ford, Cambridge, GB;
Andrew Christopher Rose, Cambridge, GB;
Antony John Penton, Cambridge, GB;
Simon Andrew Ford, Cambridge, GB;
Andrew Christopher Rose, Cambridge, GB;
ARM Limited, Cambridge, GB;
Abstract
A data processing apparatus and method provide fault tolerance when executing a sequence of data processing operations. The data processing apparatus has processing circuitry for performing the sequence of data processing operations, and a redundant copy of that processing circuitry for operating in parallel with the processing circuitry, and for performing the same sequence of data processing operations. Error detection circuitry detects an error condition when output data generated by the processing circuitry differs from corresponding output data generated by the redundant copy. Shared prediction circuitry generates predicted data input to both the processing circuitry and the redundant copy, with the processing circuitry and redundant copy then performing speculative processing of one or more data processing operations in dependence on that predicted data. Each of the processing circuitry and the redundant copy include checking circuitry for determining whether the speculative processing was correct, and initiating corrective action if the speculative processing was not correct. By sharing the prediction circuitry rather than replicating it within both the processing circuitry and the redundant copy, significant area and power consumption benefits can be achieved without affecting the ability of the apparatus to detect faults.