The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Aug. 07, 2008
Applicants:

Yoshinari Hori, Hitachinaka, JP;

Akihiro Yamada, Tokai, JP;

Takuya Yoshida, Hitachinaka, JP;

Jinichiro Goto, Mito, JP;

Inventors:

Yoshinari Hori, Hitachinaka, JP;

Akihiro Yamada, Tokai, JP;

Takuya Yoshida, Hitachinaka, JP;

Jinichiro Goto, Mito, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A data classification apparatus for classifying plural input data into plural categories, in which the apparatus includes a prototype select unit for selecting the prototype of the category nearest to the input data that has been read, a prototype evaluation unit for evaluating whether the selected prototype is proper, a prototype addition unit for adding a prototype in the case where the selected prototype is not proper and an internal data correcting unit for correcting at least one of the prototype and an area determining parameter specifying the size of the category area for each category in the case where the selected prototype is proper. The size of the category area can be set for each category, and therefore, the data can be properly classified and the judgment accuracy is improved in an application to fault detection and fault diagnosis.


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