The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Aug. 26, 2011
Applicants:

Stefan H. Warnke, Santa Cruz, CA (US);

James T. Pickett, Santa Cruz, CA (US);

Thomas Heinke, Santa Cruz, CA (US);

Inventors:

Stefan H. Warnke, Santa Cruz, CA (US);

James T. Pickett, Santa Cruz, CA (US);

Thomas Heinke, Santa Cruz, CA (US);

Assignee:

Fluke Corporation, Everett, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/08 (2006.01); G01K 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A graphical user interface for configuring parameters associated with a portable infrared imager is provided. The interface can be used to manually or automatically set range and span parameters. The interface can also be used to configure one or more alarms to notify a user that a detected temperature is outside a predetermined range. In some embodiments, a non-linear temperature scale can be displayed.


Find Patent Forward Citations

Warnke, Stefan. (2013). System and method for configuring a thermal imaging instrument (U.S. Patent No. 8483990). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8483990

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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