The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 09, 2013
Filed:
Feb. 09, 2011
Hiroyuki Tsubata, Tokyo, JP;
Hiroyuki Tsubata, Tokyo, JP;
Fuji Jukogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
The damage length measurement system has an object being measured that comprises a plurality of members is vibrated by an oscillator, and the vibration that propagates through the object being measured is detected by three sensors. A measurement apparatus analyzes that vibration wave, and measures the arrival time of the maximum peak. Using the fact that the time for a wave to propagate between two vibration detection sensors separated by a set interval is fixed, the measurement apparatus determines whether the difference in arrival time between two sensors is within a set reference range that includes the vibration propagation time between two vibration sensors. When the measurement apparatus determines that the difference is not within the set reference range, uses the fact that that wave is delayed compared to the wave that was to be detected.