The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jun. 04, 2010
Applicants:

Nathan Johnnie, Middletown, RI (US);

Lynn T. Antonelli, Cranston, RI (US);

Francis J. O'brien, Jr., Newport, RI (US);

Inventors:

Nathan Johnnie, Middletown, RI (US);

Lynn T. Antonelli, Cranston, RI (US);

Francis J. O'Brien, Jr., Newport, RI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for locating defects in a target includes subjecting the target to an ultrasonic vibration. A first laser beam is then transmitted to the target and a reflection is received. A vibration signal is produced from the reflection that gives the target's response to the ultrasonic vibration. A digital image is produced of the target that includes the region of the first laser beam reflection. The digital images are overlaid with the vibration signal to provide overlaid data. The overlaid data is tested to determine a probability of the overlaid data being non-random. The probability is compared against a threshold to indicate a potential area of concern that may include defects.


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