The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2013

Filed:

Jan. 27, 2009
Applicants:

Kwang-pyo Choi, Anyang-si, KR;

Yun-je OH, Yongin-si, KR;

Young-hun Joo, Yongin-si, KR;

Inventors:

Kwang-Pyo Choi, Anyang-si, KR;

Yun-Je Oh, Yongin-si, KR;

Young-Hun Joo, Yongin-si, KR;

Assignee:

Samsung ELectronics Co., Ltd., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, unknown;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for generating a thumbnail image are provided so that the out-of-focus (OOF) information can be ascertained from looking at the thumbnail. An input image is decoded, and a degree of the amount of OOF of the decoded image is measured (OOF information). There is a determination as to whether or not there is an EXchangeable Image File (EXIF) information about the input image. In the presence of EXIF information, a thumbnail image is extracted from the EXIF information and as much an OOF effect is applied to the thumbnail image in accordance with the degree of OOF. In the absence of the EXIF information, a thumbnail image is generated by scaling down the decoded image at a down scaler and applying as much of an OOF effect is applied to the thumbnail image in accordance with the degree of OOF.


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